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The integrated system of the confocal Raman microscope and the atomic force microscope allows various methods of microscopic analysis of the sample to be performed. The confocal microscope enables the observation and capture of a visible microscopic image. Laser light sources (532 nm and 785 nm), associated optical elements and Raman backscatter detector enable point measurements of properties on the principle of Raman spectroscopy and photoluminescent spectroscopy in two and three dimensions, which allows microscopic Raman mapping of the surface and volume of the sample surface and cross-sections of bulk free particles, granules, pellets, tablets, capsules, films, laminates, extrudates, etc.) and in a liquid medium (fibers, particles, cells, tissues, etc.).

Responsible for equipment: PhD Zoran Lavrič
URL: http://www.ffa.uni-lj.si/raziskave/raziskovalna-oprema/integrirani-sistem-konfokalnega-ramanskega-mikroskopa-in-mikroskopa-na-atomsko-silo-xplora-plus-omegascope
Access to equippment must be agreed with supervisor of the equipment. Due to delicate nature of the equipment supervisor must be present through whole agreed working time on the equipment.