The probablility for sielectric breakdown within the Mott insulator was evaluated analytically and numerically and the dependence qualitatively differs from previous theoretical proposals.
COBISS.SI-ID: 2522212
We present a calculation of the recombination rate of the excited holon-doublon pairs based on the two-dimensional model relevant for undoped cuprates, which shows that fast processes, observed in pump-probe experiments on Mott-Hubbard insulators in the picosecond range, can be explained even quantitatively with the multimagnon emission. The precondition is the existence of the Mott-Hubbard bound exciton of the s-type. We find that its decay is exponentially dependent on the Mott-Hubbard gap and on the magnon energy, with a small prefactor, which can be traced back to strong correlations and consequently large exciton-magnon coupling.
COBISS.SI-ID: 2579044