1.

Determination of detrapping times in semiconductor detectors

Scientific paper

COBISS.SI-ID: 25892391

2.

TCT measurements with slim edge strip detectors

Scientific paper

COBISS.SI-ID: 27652647

3.

Charge collection studies on custom silicon detectors irradiated up to 1.6[times]10[sup]817)n[sub](eq)/c[sup](-2)

Scientific paper

COBISS.SI-ID: 27549479

4.

Effects of accelerated long term annealing in highly irradiated n[sup]+-p strip detector examined by Edge-TCT

Scientific paper

COBISS.SI-ID: 25948455

5.

Modeling of electric field in silicon micro-strip detectors irradiated with neutrons and pions

Scientific paper

COBISS.SI-ID: 28348199