1.

TEM characterization of oxides on duplex stainless steel.

Duplex stainless steels oxidized during manufacturing process. The oxide scales are removed by chemical procedure. On the surface we can find very thin oxide layer and we analized it usin TEM.

F.02 Acquisition of new scientific knowledge

COBISS.SI-ID: 746922

2.

Preparation of thin section samples for TEM using Ar ion slicing

Recently the ion slicing technique has been well known for producing samples for transmission electron microscopy (TEM) investigations. IMT obtained the device in the frame of CoE-AMM

F.02 Acquisition of new scientific knowledge

COBISS.SI-ID: 767146