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Projects / Programmes
Infrardeča spektroskopska analiza materialov za moderne tehnologije (Slovene)
Research activity
| Code | Science | Field | Subfield |
|---|---|---|---|
| 2.09.06 | Engineering sciences and technologies | Electronic components and technologies | Characterisation of electronic components and materials |
| Code | Science | Field |
|---|---|---|
| P260 | Natural sciences and mathematics | Condensed matter: electronic structure, electrical, magnetic and optical properties, supraconductors, magnetic resonance, relaxation, spectroscopy |
| T171 | Technological sciences | Microelectronics |
Keywords
infrared spectroscopy, optical analysis, semiconductors, dielectric thin films, smart sensors
Evaluation
(metodology)
Citations
Citations for bibliographic records in COBIB.SI that are linked to records in citation databases
Organisations (2) , Researchers (2)
0104 National Institute of Chemistry
| no. | Code | Name and surname | Research area | Role | Period | No. of publicationsNo. of publications |
|---|---|---|---|---|---|---|
| 1. | 04423 | Electronic components and technologies | Head | 1998 - 2001 | 566 |
1538 University of Ljubljana, Faculty of Electrical Engineering
| no. | Code | Name and surname | Research area | Role | Period | No. of publicationsNo. of publications |
|---|---|---|---|---|---|---|
| 1. | 03494 | Electronic components and technologies | Researcher | 1998 - 2001 | 179 |
Abstract
A non-contact, non-destructive, and highly precise optical characterisation method for materials used in modern technologies will be developed. The method will be applied also for describing the optical properties of materials in the infrared spectral region, whereas the thermal exchange of the sample with the surrounding will be followed in particular. Special attention will be given to materials that are suitable for application in smart sensors formed by micromachining technology.