Equipment source: ARIS

Equipment for tunneling and probe microscopy

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Purpose of equipment
The atomic force microscope - AFM is intended for both basic characterization and more specific measurements of the properties of surfaces, nanomaterials, electronic devices, biological molecules, etc. It enables operation in contact and probe mode, measurements of phases and lateral forces, microscopy of magnetic forces. FAST STM is an upgrade for the tunneling microscope that enables fast imaging, up to 50 Hz per image (frame rate). The upgrade enables imaging of dynamic processes that are 3 orders of magnitude faster than usual, thereby opening up possibilities for additional insight into fast dynamics. An optical delay line allows the adjustment of light burst delays in combination with fast STM.
Access of equipment
Responsible for equipment: PhD Dragan D. Mihailović
Equipment is available on demand. Training can be arranged. The price of services depends on complexity of the measurements. Contact damjan.svetin@ijs.si
ARIS research and infrastructure programmes (1) Legend
no. Code Title Period Head No. of publications
1.  P1-0040  Nonequilibrium Quantum System Dynamics  1/1/2022 - 12/31/2027  PhD Dragan D. Mihailović  1,789 
Organisations (1)
no. Code Research organisation City Registration number No. of publications
1.  0106  Jožef Stefan Institute  Ljubljana  5051606000  93,831 
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