Equipment source: ARIS

Scanning electron microscope with field emission gun (FEG) electron source (Jeol JEM-7600F)

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Purpose of equipment
The FEG-SEM is state-of-art scanning electron microscope that enables complete microstructural characterization of materials: image resolution of few nm, qualitative and quantitative chemical analysis on micron scale and electron litography.
Access of equipment
Responsible for equipment: PhD Miran Čeh
URL: https://www.ijs.si/ijsw/Znotraj%20hi%C5%A1e/Desno?action=AttachFile&do=get&tar get=ARRS_Evidenca_opreme_2021.xlsx
Specific training is required to operate the equipment. Trained operaters can perform analyses for users from other research institutions. Price is dependent on a complexity of analyses.
Research projects (3) Legend
no. Code Title Period Head No. of publications
1.  J2-7133  Fabrication of Novel Thin Films by Pulsed-Laser Ablation with in situ ICP-MS Analysis of Target Plumes for Deposition Control  9/1/2005 - 8/31/2008  PhD Johannes Teun Van Elteren  1,932 
2.  J2-6705  Layered ceramic nanostructures and 2D nanoparticles arrays  7/1/2004 - 6/30/2007  PhD Miran Čeh  4,712 
3.  Z2-6621  Quantitative Z-contrast microscopy of functional ceramics  7/1/2004 - 6/30/2006  PhD Spomenka Kobe  1,388 
ARIS research and infrastructure programmes (1) Legend
no. Code Title Period Head No. of publications
1.  P2-0084  Nanostructured Materials  1/1/2009 - 12/31/2014  PhD Spomenka Kobe  6,290 
Organisations (1)
no. Code Research organisation City Registration number No. of publications
1.  0106  Jožef Stefan Institute  Ljubljana  5051606000  93,831 
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